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Demo: Nanotechnology
Patent Analysis
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Description |
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Nanotechnology
holds the promise of revolutionizing
a wide range of significant application
areas and has been recognized by most
countries as the technology area critical
to a nation's future technology competence.
We provide an international patent
analysis using the US Patent and Trademark
Office (USPTO) data searched by keywords
of the entire text: title, abstract,
claims, and specifications. We analyzed
the technology development performance,
knowledge flow patterns, and major
areas of development of various countries,
institutions, and technology fields
and have identified new trends of
National Science Foundation (NSF)
developments, which are summarized
by countries, institutions, and technology
fields.
Also we provide a comprehensive analysis
of NSF funding support in Nanoscale
Science and Engineering (NSE) and
its relationship to the innovation
reflected in the patent data. The
NSF support to NSE as described by
the NSF grant dataset and its impact
on technological innovation as described
by the USPTO patent dataset have been
analyzed using a combination of basic
bibliometric analysis and advanced
content and citation visualization
tools, we identified the general trend,
key players, and technology topic
distribution and evolution in grant
and patenting activities in the nanotechnology
field. This study shows that the NSF-funded
researchers, who are NSE patent inventors
and also the principle investigators
of NSE-related NSF grants, referred
to as “PI-inventors” in
our study, in average had significantly
higher impact in nanotechnology development
than other comparison groups reflected
in the patent citation data.
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| Acknowledgements |
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We
would like to express our gratitude
to NSF Digital Library Initiative-2,
"High-performance Digital Library
Systems: From Information Retrieval
to Knowledge Management,"
IIS-9817473, April 1999-March 2002
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| Approach
& Methodology |
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Testbed:
- US Patent and Trademark Office
(USPTO) data searched by keywords
of the entire text: title, abstract,
claims, and specifications.
- 122,778 grant awards in all science
and engineering fields accessed
at http://www.nsf.gov/awardsearch/index.jsp
Techniques:
Citation network analysis
- Graphviz, an open source graph
drawing software, provided by AT&T
Labs (Gansner and North, 2000) (available
at: http://www.research.att.com/sw/tools/graphviz/).
For instance, the country citation
network between 1976 and 2002 is
shown in Figure 2 (with the citation
count threshold of 10).
Figure 3.
Country Citation Network: 1976 –
2002 (Citation counts > 10)
- NetDraw, a free network drawing
program by Steve Borgatti (available
at: http://www.analytictech.com/downloadnd.htm)
Figure 11 shows the citation network
for the largest NSE field “Chemistry:
molecular biology and microbiology.”
Figure
3. Patent citation network: “Chemistry:
molecular biology and microbiology”
- Statistical Hypothesis Testing
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| Team
Members |
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| Publications |
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| Z. Huang,
H. Chen, Z.-K. Chen and M. C. Roco,
"International
Nanotechnology Development in 2003:
Country, Institution, and Technology
Field Analysis Based on USPTO Patent
Database," Journal of Nanoparticale
Research (JNR), 6(4), 325-354, (2004).
Z. Huang, H. Chen, A. Yip, G. Ng,
F. Guo, Z.-K. Chen and M. C. Roco,
“Longitudinal
Patent Analysis for Nanoscale Science
and Engineering: Country, Institution
and Technology Field,” Journal
of Nanoparticale Research (JNR), 5,
333-363, (2003).
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